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Ultramicroscopy|January 9, 2013
Electrostatic simulations of a local electrode atom probe: the dependence of tomographic reconstruction parameters on specimen and microscope geometryShyeh Tjing Loi, Baptiste Gault, Simon P Ringer, et al.Ultramicroscopy|January 1, 2013
Quantitative three-dimensional carrier mapping in nanowire-based transistors using scanning spreading resistance microscopyA Schulze, T Hantschel, P Eyben, et al.Ultramicroscopy|August 7, 2013
Valence electron energy-loss spectroscopy study of ZrSiO₄ and ZrO₂Nan Jiang, John C H SpenceUltramicroscopy|August 20, 2013
Nanofabrication of a gold fiducial array on specimen support for electron tomographyRoman I Koning, Vladimir G Kutchoukov, Cornelis W Hagen, et al.Ultramicroscopy|August 15, 2013
Strain mapping in selected area electron diffraction method combining a Cs-corrected TEM with a stage scanning systemFumihiko UesugiUltramicroscopy|August 6, 2013
Determination of aberration center of Ronchigram for automated aberration correctors in scanning transmission electron microscopyTakumi Sannomiya, Hidetaka Sawada, Tomohiro Nakamichi, et al.Ultramicroscopy|June 4, 2013
Growth mode and oxidation state analysis of individual cerium oxide islands on Ru(0001)J I Flege, B Kaemena, S D Senanayake, et al.Ultramicroscopy|June 6, 2013
Validities of three multislice algorithms for quantitative low-energy transmission electron microscopyW Q Ming, J H ChenUltramicroscopy|April 25, 2013
Growth of magnetic nanowires on self-organized stripe templates: Fe on Pd-O/W(110)T O Menteş, A Locatelli, L Aballe, et al.Ultramicroscopy|May 17, 2013
XEDS STEM tomography for 3D chemical characterization of nanoscale particlesArda Genc, Libor Kovarik, Meng Gu, et al.Pageof 460