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Ultramicroscopy|May 28, 2023
Focused light introduction into transmission electron microscope via parabolic mirrorYoshikazu Adachi, Naoki Yamamoto, Takumi SannomiyaUltramicroscopy|March 10, 2009
A model of secondary electron imaging in the helium ion scanning microscopeRanjan Ramachandra, Brendan Griffin, David JoyUltramicroscopy|April 11, 2016
Towards an accurate volume reconstruction in atom probe tomographyDaniel Beinke, Christian Oberdorfer, Guido SchmitzUltramicroscopy|January 1, 1980
Does removal of hydrogen change the electron energy-loss spectra of DNA bases?H SchnablUltramicroscopy|May 20, 2026
Effect of accelerating voltages on indexing of SEM-EBSD via pattern matchingTomotaka Hatakeyama, Kota SawadaUltramicroscopy|May 23, 2026
Comparing sub-gap and above-gap pulsed radiation sources for measuring oxygen concentration in MgO using atom probe tomographyAnn N Chiaramonti, Benjamin W Caplins, Christopher E Mead, et al.Ultramicroscopy|May 21, 2026
Component substitution and multiresolution analysis on hyperspectral microwave microscopy data setsEthan Saul Carrizales Alvarez, Olaf C Haenssler, Leopoldo Altamirano RoblesUltramicroscopy|May 18, 2026
Minimizing off-axis aberrations in multi-beam electron optical systems: An analytical approachWeixia Zhao, Lingchao Bai, Lixin Zhang, et al.Ultramicroscopy|January 2, 2013
Atomic engineering of platinum alloy surfacesTong Li, P A J Bagot, E A Marquis, et al.Ultramicroscopy|April 22, 2015
Observation of co-segregation of titanium and boron at the interface between recrystallized and unrecrystallized grains in cold-rolled interstitial-free steel sheetsJ Takahashi, J Haga, K Kawakami, et al.Pageof 460