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Ultramicroscopy|May 31, 2015
Grain boundary study of technically pure molybdenum by combining APT and TKDK Babinsky, W Knabl, A Lorich, et al.
Ultramicroscopy|June 25, 2019
Depth-profiling of nickel nanocrystal populations in a borosilicate glass - A combined TEM and XRM studyL C Briese, S Selle, C Patzig, et al.
Ultramicroscopy|August 30, 2005
Experimental and theoretical improvements on understanding of the O K-edge of TeO2Nan Jiang, Bin Jiang, Rolf Erni, et al.
Ultramicroscopy|February 20, 2007
Measurement and estimation of temperature rise in TEM sample during ion millingYoung Min Park, Dong-Su Ko, Kyung-Woo Yi, et al.
Ultramicroscopy|November 3, 2006
A method of combining STEM image with parallel beam diffraction and electron-optical conditions for diffractive imagingHaifeng He, Chris Nelson
Ultramicroscopy|January 9, 2007
Prospects for aberration corrected electron precessionC S Own, W Sinkler, L D Marks
Ultramicroscopy|November 27, 2007
Microscopic tomography with ultra-HVEM and applicationsAkio Takaoka, Toshiaki Hasegawa, Kiyokazu Yoshida, et al.
Ultramicroscopy|May 27, 2008
On the interpretation of the forbidden spots observed in the electron diffraction patterns of flat Au triangular nanoparticlesJ Reyes-Gasga, A Gómez-Rodríguez, Xiaoxia Gao, et al.
Ultramicroscopy|March 23, 2010
Identification of magnetic properties of few nm sized FePt crystalline particles by characterizing the intrinsic atom order using aberration corrected S/TEMJohannes Biskupek, Joerg R Jinschek, Ulf Wiedwald, et al.
Ultramicroscopy|December 17, 2010
Investigation of wüstite (Fe1-xO) by femtosecond laser assisted atom probe tomographyM Bachhav, R Danoix, F Danoix, et al.
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