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Ultramicroscopy|June 25, 2021
The differential phase contrast uncertainty relation: Connection between electron dose and field resolutionSimon Pöllath, Felix Schwarzhuber, Josef ZweckUltramicroscopy|June 30, 2023
Extracting transverse electron mean free paths in graphene at low energyPeter S Neu, Daniël Geelen, Rudolf M Tromp, et al.Ultramicroscopy|December 18, 2022
Dose efficient annular bright field contrast with the ISTEM method: A proof of principle demonstrationFlorian F Krause, Marco Schowalter, Beeke Gerken, et al.Ultramicroscopy|February 22, 2023
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEMKayla X Nguyen, Jeffrey Huang, Manohar H Karigerasi, et al.Ultramicroscopy|August 16, 2023
A method for estimating magnetic field of TEM objective lensD A Tatarskiy, N S Gusev, S A GusevUltramicroscopy|June 4, 2026
Field emission characterization of CNT-coated paper and laboratory tissue emitters with variable tip anglesKamil Baranowski, Michał KrysztofUltramicroscopy|November 11, 1998
Characterization of the low magnification performance of a Philips CM300-FEGY Cheng, K A TaylorUltramicroscopy|March 6, 2010
Novel operation mode for eliminating influence of inclination angle and friction in atomic force microscopyFei Wang, Yueyu Wang, Faquan Zhou, et al.Ultramicroscopy|January 11, 2000
Theoretical study of field emission by a four atoms nanotip: implications for carbon nanotubes observationC H Adessi, M DevelUltramicroscopy|January 22, 2003
Field electron and ion emission from charged surfaces: a strategic historical review of theoretical conceptsRichard G ForbesPageof 460