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Ultramicroscopy|March 8, 2003
Interaction forces and conduction properties between multi wall carbon nanotube tips and Au(111)M Luna, P J de Pablo, J Colchero, et al.Ultramicroscopy|July 1, 1975
Development of methodology for low exposure, high resolution electron microscopy of biological specimensI A Kuo, R M GlaeserUltramicroscopy|January 14, 2003
Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscopeT Uhlig, M Heumann, J ZweckUltramicroscopy|December 1, 1975
Topographical contrast in the transmission electron microscopeA G Cullis, D M MaherUltramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.Ultramicroscopy|April 11, 2002
Electron nanodiffraction methods for measuring medium-range orderJ M CowleyUltramicroscopy|April 27, 2005
Atomic force microscopy imaging and 3-D reconstructions of serial thin sections of a single cell and its interior structuresYong Chen, Jiye Cai, Tao Zhao, et al.Ultramicroscopy|March 30, 2004
[001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001)X Z Liao, J Zou, D J H Cockayne, et al.Ultramicroscopy|March 30, 2004
Investigation of hexagonal and cubic GaN by high-resolution electron energy-loss spectroscopy and density functional theoryS Lazar, C Hébert, H W ZandbergenUltramicroscopy|March 30, 2004
Atomic imaging in aberration-corrected high-resolution transmission electron microscopyJ H Chen, H W Zandbergen, D Van DyckPageof 460