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Ultramicroscopy|December 27, 2016
A bimodal tomographic reconstruction technique combining EDS-STEM and HAADF-STEMZhichao Zhong, Bart Goris, Remco Schoenmakers, et al.
Ultramicroscopy|October 30, 2016
Quantitative EDXS: Influence of geometry on a four detector systemJohanna Kraxner, Margit Schäfer, Otto Röschel, et al.
Ultramicroscopy|November 14, 2016
Structural defects in cubic semiconductors characterized by aberration-corrected scanning transmission electron microscopyYadira Arroyo Rojas Dasilva, Roksolana Kozak, Rolf Erni, et al.
Ultramicroscopy|January 10, 2017
Calibrating conservative and dissipative response of electrically-driven quartz tuning forksLifeng Hao, Qi Wang, Ping Peng, et al.
Ultramicroscopy|December 8, 2016
On the influence of the electron dose rate on the HRTEM image contrastJuri Barthel, Markus Lentzen, Andreas Thust
Ultramicroscopy|December 25, 2016
Analysis of electron energy loss spectroscopy data using geometric extraction methodsJakob Spiegelberg, Ján Rusz, Thomas Thersleff, et al.
Ultramicroscopy|February 8, 2014
Low-energy electron holographic imaging of gold nanorods supported by ultraclean grapheneJean-Nicolas Longchamp, Conrad Escher, Tatiana Latychevskaia, et al.
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