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Ultramicroscopy|March 24, 2017
STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimensJan Oliver Oelerich, Lennart Duschek, Jürgen Belz, et al.Ultramicroscopy|March 4, 2019
High throughput scanning μLEED imaging of surface structural heterogeneity: Defective graphene on Cu(111)K L W Lau, K M Yu, D Luo, et al.Ultramicroscopy|March 2, 2019
Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanateJohannes Jobst, Laurens M Boers, Chunhai Yin, et al.Ultramicroscopy|March 6, 2019
Selected energy dark-field imaging using low energy electrons for optimal surface phase discriminationY R Niu, J Pereiro, D Gomez, et al.Ultramicroscopy|March 24, 2019
The Dresden in-situ (S)TEM special with a continuous-flow liquid-helium cryostatFelix Börrnert, Felix Kern, Franziska Harder, et al.Ultramicroscopy|March 30, 2019
Insights into image contrast from dislocations in ADF-STEME Oveisi, M C Spadaro, E Rotunno, et al.Ultramicroscopy|March 30, 2019
Automatic 3D reconstruction of SEM images based on Nano-robotic manipulation and epipolar plane imagesWeili Ding, Yanxin Zhang, Haojian Lu, et al.Ultramicroscopy|April 2, 2019
High throughput crystal structure and composition mapping of crystalline nanoprecipitates in alloys by transmission Kikuchi diffraction and analytical electron microscopyArunodaya Bhattacharya, Chad M Parish, Jean Henry, et al.Ultramicroscopy|March 5, 2017
Progress and opportunities in EELS and EDS tomographySean M Collins, Paul A MidgleyPageof 460