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Ultramicroscopy|January 1, 1980
High resolution cold stage for the JEOL 100B and 100C electron microscopesS B Hayward, R M Glaeser
Ultramicroscopy|January 24, 2026
Mode-dependent phonon relaxation in time-resolved electron diffraction pattern simulationsWojciech Marciniak, Joanna Marciniak, José Ángel Castellanos-Reyes, et al.
Ultramicroscopy|January 17, 2026
A universal FIB approach for contamination- and damage-free plan-view TEM lamellae using NaCl sacrificial layersChen Liu, Jingkai Xu, Qingxiao Wang, et al.
Ultramicroscopy|January 10, 2026
Morphologies of caustics studied by catastrophe charged-particle opticsTom Fraysse, Robin Cours, Hugo Lourenço-Martins, et al.
Ultramicroscopy|January 1, 1981
Parallel recording of electron energy loss spectraH Shuman
Ultramicroscopy|March 5, 2023
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)Abdalrhaman Koko, Vivian Tong, Angus J Wilkinson, et al.
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