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Ultramicroscopy|September 11, 2012
Atomic force microscope based biomolecular force-clamp measurements using a micromachined electrostatic actuatorHamdi Torun, Ofer Finkler, F Levent DegertekinUltramicroscopy|November 13, 2012
Influence of total beam current on HRTEM image resolution in differentially pumped ETEM with nitrogen gasA N Bright, K Yoshida, N TanakaUltramicroscopy|November 13, 2012
Simulation of the backscattered electron intensity of multi layer structure for the explanation of secondary electron contrastA Sulyok, A L Toth, L Zommer, et al.Ultramicroscopy|September 4, 2012
Microwave TM(010) cavities as versatile 4D electron optical elementsP L E M Pasmans, G B van den Ham, S F P Dal Conte, et al.Ultramicroscopy|September 7, 2012
Advanced reconstruction algorithms for electron tomography: from comparison to combinationB Goris, T Roelandts, K J Batenburg, et al.Ultramicroscopy|September 7, 2012
Effect of an ultrafast laser induced plasma on a relativistic electron beam to determine temporal overlap in pump-probe experimentsCheyne M Scoby, R K Li, P MusumeciUltramicroscopy|September 7, 2012
Study of atomic structure and electronic structure of an AA'3B4O12 double-perovskite CaCu3Ir4O12 using STEM imaging and EELS techniquesY Xin, H D Zhou, J G Cheng, et al.Ultramicroscopy|August 11, 2020
Micrograph contrast in low-voltage SEM and cryo-SEMLucy Liberman, Olga Kleinerman, Irina Davidovich, et al.Ultramicroscopy|August 14, 2020
EBSD pattern simulations for an interaction volume containing lattice defectsChaoyi Zhu, Marc De GraefPageof 460