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Ultramicroscopy|April 21, 2022
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopyLi Zhao, Xiaowei Du, Bin Fang, et al.Ultramicroscopy|July 31, 2022
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopyDohyeon Jeon, Haesol Kim, Minji Gu, et al.Ultramicroscopy|April 2, 2021
A Crystallography-Mediated Reconstruction (CMR) Approach for Atom Probe Tomography: Solution for a Singleton PoleAlec C Day, Andrew J Breen, Simon P RingerUltramicroscopy|May 14, 2023
Versatile procedure for the correction of non-isochromatism in XPEEM spectroscopic imagingSebastian Günther, Tim Kratky, Jürgen Kraus, et al.Ultramicroscopy|April 14, 2023
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable gratingWen Tan, Zhaohui Tang, Guangxu Xiao, et al.Ultramicroscopy|April 24, 2023
Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEMLijun Wu, Myung-Geun Han, Yimei ZhuUltramicroscopy|January 1, 1988
Capabilities and limitations of probe methods for the microanalysis of chemical elements in biology: a brief introductionT A HallUltramicroscopy|April 4, 2021
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalescedT J O'Hanlon, T Zhu, F C-P Massabuau, et al.Ultramicroscopy|April 23, 2021
Beam shaping and probe characterization in the scanning electron microscopeT Řiháček, M Horák, T Schachinger, et al.Ultramicroscopy|April 25, 2021
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscopeM Krysztof, M Białas, P Szyszka, et al.Pageof 460