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Ultramicroscopy|January 28, 2024
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mappingRaissa Lima de Oblitas, Flávio Bueno de Camargo Junior, Wagner Vidal Magalhães, et al.
Ultramicroscopy|February 3, 2024
Accurate and fast localization of EBSD pattern centers for screen moving technologyWei Li, Xingui Zhou, Jingchao Xu, et al.
Ultramicroscopy|February 4, 2024
Automatic center identification of electron diffraction with multi-scale transformer networksMengshu Ge, Yue Pan, Xiaozhi Liu, et al.
Ultramicroscopy|January 13, 2024
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscurationAtoosa Dejkameh, Ricarda Nebling, Uldis Locans, et al.
Ultramicroscopy|August 29, 2024
Differential phase contrast STEM image calculation software - MagnifierI S Pavlov, B I Kineev, A V Morozov, et al.
Ultramicroscopy|August 24, 2024
Autoencoder latent space sensitivity to material structure in convergent-beam low energy electron diffractionM Ivanov, J Pereiro
Ultramicroscopy|September 14, 2024
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materialsCarter Francis, Paul M Voyles
Ultramicroscopy|September 14, 2024
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomographyPatrick Harrison, Saurabh Mohan Das, William Goncalves, et al.
Ultramicroscopy|September 20, 2024
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopyMauricio Cattaneo, Knut Müller-Caspary, Juri Barthel, et al.
Ultramicroscopy|October 6, 2024
Application of a novel local and automatic PCA algorithm for diffraction pattern denoising in TEM-ASTAR analysis in microelectronicsTony Printemps, Karen Dabertrand, Jérémy Vives, et al.
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