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Ultramicroscopy|October 10, 2024
Exploring deep learning models for 4D-STEM-DPC data processingGregory Nordahl, Sivert Dagenborg, Jørgen Sørhaug, et al.
Ultramicroscopy|September 28, 2024
Ultra-low-noise transimpedance amplifier with a single HEMT in pre-amplifier for measuring shot noise in cryogenic STMYing-Xin Liang
Ultramicroscopy|May 11, 2025
An improved soft-thresholding exit wave reconstruction for imaging beam-sensitive materialsHongsheng Shi, Yuan Lu, Zeyu Wang, et al.
Ultramicroscopy|May 21, 2025
Data-driven control in atomic force microscopy using a genetic algorithmNavid Asmari, Lukas Neuner, Richard Weiss, et al.
Ultramicroscopy|April 25, 2025
Capacitance compensation on a double-barrel nanopipette for improving current detection of scanning ion conductance microscopyFutoshi Iwata, Naoto Fukuzawa, Hitoshi Inomata, et al.
Ultramicroscopy|April 12, 2025
Emittance minimization for aberration correction II: Physics-informed Bayesian optimization of an electron microscopeDesheng Ma, Steven E Zeltmann, Chenyu Zhang, et al.
Ultramicroscopy|April 13, 2025
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficientsDesheng Ma, Steven E Zeltmann, Chenyu Zhang, et al.
Ultramicroscopy|March 1, 2025
Quantifying elemental colocation in nanostructured materials using energy-dispersive X-ray spectroscopyKristiaan H Helfferich, Johannes D Meeldijk, Marijn A van Huis, et al.
Ultramicroscopy|May 19, 2024
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopyXinyu Li, Longyun Chen, Sudong Kong, et al.
Ultramicroscopy|June 15, 2024
Origin of giant enhancement of phase contrast in electron holography of modulation-doped n-type GaNK Ji, M Schnedler, Q Lan, et al.
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