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Ultramicroscopy|December 23, 2025
TRPXv2.0: superfast, parallel compression of diffraction patterns and images, with native Python and HDF5 supportS Matinyan, P Filipcik, D G Waterman, et al.
Ultramicroscopy|November 27, 2025
Sensitivity of multislice electron ptychography to point defects: A case study in SiCAaditya Bhat, Colin Gilgenbach, Junghwa Kim, et al.
Ultramicroscopy|May 1, 2024
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopyWen Feng, Thomas Gemming, Lars Giebeler, et al.
Ultramicroscopy|May 1, 2024
Standardization and quantification of backscattered electron imaging in scanning electron microscopyShih-Ming Wang, Yu-Cheng Chiu, Yu-Hsin Wu, et al.
Ultramicroscopy|April 14, 2024
Secondary-electron imaging of bulk crystalline specimens in an aberration corrected STEMSooyeon Hwang, Lijun Wu, Kim Kisslinger, et al.
Ultramicroscopy|December 15, 2023
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopyA Gholinia, J Donoghue, A Garner, et al.
Ultramicroscopy|December 19, 2023
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?Peter Rez
Ultramicroscopy|December 22, 2023
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environmentJeong-Woong Lee, In-Yong Park, Takashi Ogawa
Ultramicroscopy|September 19, 2018
An improved iterative wave function reconstruction algorithm in high-resolution transmission electron microscopyW Q Ming, J H Chen, Y T He, et al.
Ultramicroscopy|June 19, 2026
Atomic-scale measurements with custom-built scanning tunneling microscopes in specialized environmentsBehnam Esmaeilzadeh, Muhammad Touqeer, Sihao Li, et al.
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