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Ultramicroscopy|July 26, 2014
Dynamical effects in strain measurements by dark-field electron holographyE Javon, A Lubk, R Cours, et al.
Ultramicroscopy|January 24, 2007
Direct electron crystallographic determination of zeolite zonal structuresDouglas L Dorset, Christopher J Gilmore, Jose Luis Jorda, et al.
Ultramicroscopy|December 1, 1976
The modification of the electron microscope for special crystallographic applicationsW C Dowell, D Williams
Ultramicroscopy|March 22, 2005
CBED study of grain misorientations in AlGaN epilayersS-L Sahonta, D Cherns, R Liu, et al.
Ultramicroscopy|July 25, 2026
Using stretching-modulation-compression effect to generate isolated few-femtosecond MeV electron bunchesCheng-Ying Tsai, Weilun Qin, Jiapeng Li, et al.
Ultramicroscopy|August 10, 2026
Electron-optical systems with a cathode lens in telescopic modeA A Trubitsyn, E Yu Grachev, E G Kochergin
Ultramicroscopy|August 12, 2026
Overcoming physical approximation limitations of nanometal thin film thickness measurement by physics-informed neural networksWenjie Feng, Yuxin Zhang, Yu Zhang, et al.
Ultramicroscopy|October 13, 2026
A differential algebra computational framework for high-order aberration analysis of electromagnetic lensesZhicheng Liu, Shikai Zhu, Xu Liu, et al.
Ultramicroscopy|September 17, 2026
Sampling mismatch and correction for ptychographic single-particle analysisTianyuan Li, Shouqing Li, Zhaoyi Yan, et al.
Ultramicroscopy|October 5, 2026
Pushing the limits of energy resolution by combining monochromated EELS with the CEOS energy-filtering and imaging device in the JEOL atomic-resolution multi-dimensional TEMTobias Heil, Heiko Müller, Stephan Uhlemann, et al.
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