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Ultramicroscopy|August 10, 2010
Double aberration correction in a low-energy electron microscopeTh Schmidt, H Marchetto, P L Lévesque, et al.Ultramicroscopy|May 18, 2010
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mappingC Rodenburg, M A E Jepson, E G T Bosch, et al.Ultramicroscopy|May 18, 2010
Determination of analytical expansion from numerical field dataTomás Radlicka, Bohumila LencováUltramicroscopy|May 25, 2010
Scanning transmission X-ray microscopy with a fast framing pixel detectorA Menzel, C M Kewish, P Kraft, et al.Ultramicroscopy|September 25, 2010
Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopyMasanori Koshino, Hiroki Kurata, Seiij IsodaUltramicroscopy|September 25, 2010
The transverse structure of cold field electron emissionC J EdgcombeUltramicroscopy|June 18, 2010
A TEM phase plate loading system with loading monitoring and nano-positioning functionsJessie Shiue, Shao-Kang HungUltramicroscopy|July 13, 2010
The process of collagen biomineralization observed by AFM in a model dual membrane diffusion systemHongxia Zhao, Hua Jin, Jiye Cai, et al.Ultramicroscopy|January 14, 2011
A sensitivity analysis of the maximum separation method for the characterisation of solute clustersJ M Hyde, E A Marquis, K B Wilford, et al.Ultramicroscopy|December 21, 2010
Beyond the crystallization paradigm: structure determination from diffraction patterns from ensembles of randomly oriented particlesH C Poon, D K SaldinPageof 460