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Ultramicroscopy|August 28, 2025
Impact of electron beam propagation on high-resolution quantitative chemical analysis of 1-nm-wide GaN/AlGaN quantum wellsFlorian Castioni, Patrick Quéméré, Sergi Cuesta, et al.Ultramicroscopy|July 24, 2015
Electron tomography based on highly limited data using a neural network reconstruction techniqueEva Bladt, Daniël M Pelt, Sara Bals, et al.Ultramicroscopy|July 18, 2016
Detection of water and its derivatives on individual nanoparticles using vibrational electron energy-loss spectroscopyPeter A Crozier, Toshihiro Aoki, Qianlang LiuUltramicroscopy|January 1, 1985
The influence of objective lens aberrations in energy-loss spectrometryP Kruit, H ShumanUltramicroscopy|July 8, 2015
The growth of α-sexithiophene films on Ag(111) studied by means of PEEM with linearly polarized lightThorsten Wagner, Ebrahim Ghanbari, Daniel Huber, et al.Ultramicroscopy|July 14, 2015
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrumentDaniël Geelen, Aniket Thete, Oliver Schaff, et al.Ultramicroscopy|June 24, 2015
Atomic force microscope caliper for critical dimension measurements of micro and nanostructures through sidewall scanningHui Xie, Danish Hussain, Feng Yang, et al.Ultramicroscopy|July 6, 2015
Interface segregation behavior in thermal aged austenitic precipitation strengthened stainless steelHui Li, Hui Song, Wenqing Liu, et al.Ultramicroscopy|July 21, 2015
Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioningAndrew J Breen, Michael P Moody, Anna V Ceguerra, et al.Ultramicroscopy|May 30, 2015
Contrast and decay of cathodoluminescence from phosphor particles in a scanning electron microscopeDaniel den Engelsen, Paul G Harris, Terry G Ireland, et al.Pageof 460