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Ultramicroscopy|March 13, 2018
Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparationJ Bogdanowicz, A Kumar, C Fleischmann, et al.
Ultramicroscopy|February 8, 2018
2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysisA Pofelski, S Y Woo, B H Le, et al.
Ultramicroscopy|February 8, 2018
Quantification of nanomechanical properties of surfaces by higher harmonic monitoring in amplitude modulated AFM imagingFederico Gramazio, Matteo Lorenzoni, Francesc Pérez-Murano, et al.
Ultramicroscopy|February 8, 2018
Charge accumulation in electron cryomicroscopyChristopher J Russo, Richard Henderson
Ultramicroscopy|February 8, 2018
"One-sample concept" micro-combinatory for high throughput TEM of binary filmsGyörgy Sáfrán
Ultramicroscopy|March 3, 2018
Thermal expansion coefficient measurement from electron diffraction of amorphous films in a TEMMisa Hayashida, Kai Cui, Marek Malac, et al.
Ultramicroscopy|March 3, 2018
Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation frameworkSiavash Maraghechi, Johan P M Hoefnagels, Ron H J Peerlings, et al.
Ultramicroscopy|February 11, 2018
Charge dynamics in aluminum oxide thin film studied by ultrafast scanning electron microscopyMaurizio Zani, Vittorio Sala, Gabriele Irde, et al.
Ultramicroscopy|February 12, 2018
Design of an electrostatic phase shifting device for biological transmission electron microscopyPhilip J B Koeck
Ultramicroscopy|November 18, 2017
Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patternsTravis M Rampton, Stuart I Wright, Michael P Miles, et al.
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