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Ultramicroscopy|October 9, 2017
Optimization of digital image processing to determine quantum dots' height and density from atomic force microscopyJ E Ruiz, S Paciornik, L D Pinto, et al.
Ultramicroscopy|November 6, 2017
Reduced electron exposure for energy-dispersive spectroscopy using dynamic samplingYan Zhang, G M Dilshan Godaliyadda, Nicola Ferrier, et al.
Ultramicroscopy|November 6, 2017
Towards atomically resolved EELS elemental and fine structure mapping via multi-frame and energy-offset correction spectroscopyYi Wang, Michael R S Huang, Ute Salzberger, et al.
Ultramicroscopy|November 7, 2017
Reprint of Unaltered reversible magnetic transition in Fe nanostructures upon ambient exposureA Quesada, R Gargallo-Caballero, Y Montaña, et al.
Ultramicroscopy|December 21, 2018
Current driven magnetic actuation of a MEMS silicon beam in a transmission electron microscopeNicolas Lobato-Dauzier, Matthieu Denoual, Takaaki Sato, et al.
Ultramicroscopy|December 23, 2018
Progress in ultrahigh energy resolution EELSO L Krivanek, N Dellby, J A Hachtel, et al.
Ultramicroscopy|January 7, 2019
Time-of-flight secondary ion mass spectrometry in the helium ion microscopeN Klingner, R Heller, G Hlawacek, et al.
Ultramicroscopy|March 30, 2007
GaBi alloy liquid metal ion source for microelectronics researchL Bischoff, W Pilz, Th Ganetsos, et al.
Ultramicroscopy|March 30, 2007
Development of atom probe specimen preparation techniques for specific regions in steel materialsJun Takahashi, Kazuto Kawakami, Yukiko Yamaguchi, et al.
Ultramicroscopy|April 3, 2007
Performance of local electrodes in the local electrode atom probeK F Russell, M K Miller, R M Ulfig, et al.
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