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Ultramicroscopy|April 3, 2007
Some aspects of the silicon behaviour under femtosecond pulsed laser field evaporationM Gilbert, F Vurpillot, A Vella, et al.Ultramicroscopy|April 3, 2007
Study of the influence of the dielectric layer thickness in a CNT-FEDXing Su, Lifang Zhang, Wei Lei, et al.Ultramicroscopy|February 24, 2007
An inverse problem of estimating the heat source in tapered optical fibers for scanning near-field optical microscopyHaw-Long Lee, Win-Jin Chang, Wen-Lih Chen, et al.Ultramicroscopy|September 26, 2006
Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographsK Du, K von Hochmeister, F PhillippUltramicroscopy|February 20, 2007
A Bloch wave analysis of optical sectioning in aberration-corrected STEME C Cosgriff, P D NellistUltramicroscopy|March 6, 2007
An alternative approach to carbon nanotube sample preparation for TEM investigationM Caplovicova, T Danis, D Buc, et al.Ultramicroscopy|March 17, 2007
Accurate labeling of the light-actinide O(4,5) edgesKevin T Moore, Gerrit van der LaanUltramicroscopy|November 1, 2006
Separation of bulk and surface-losses in low-loss EELS measurements in STEMK A Mkhoyan, T Babinec, S E Maccagnano, et al.Ultramicroscopy|November 8, 2006
Effective removal of Ga residue from focused ion beam using a plasma cleanerDong-Su Ko, Young Min Park, Sung-Dae Kim, et al.Ultramicroscopy|October 19, 2006
MAC mode atomic force microscopy studies of living samples, ranging from cells to fresh tissueGuanglu Ge, Dong Han, Danying Lin, et al.Pageof 460