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Ultramicroscopy|May 11, 2007
Standard deviations of composition measurements in atom probe analyses-Part II: 3D atom probeF Danoix, G Grancher, A Bostel, et al.
Ultramicroscopy|June 15, 2007
Variable-force tapping atomic force microscopy as a tool in the characterization of organic devicesAgnieszka Iwasiewicz-Wabnig, Joon-Ho Shin, Steven Xiao, et al.
Ultramicroscopy|June 15, 2007
Investigation of hole states near the Fermi level in Nb(1-)(x)Mg(x)B(2) by electron energy-loss spectroscopy and first-principles calculationsC Ma, R J Xiao, H X Geng, et al.
Ultramicroscopy|June 15, 2007
Force-clamp spectroscopy with a small dithering of AFM tip, and its application to explore the energy landscape of single avidin-biotin complexM Favre, L A Chtcheglova, D A Lapshin, et al.
Ultramicroscopy|May 12, 2007
Standard deviations of composition measurements in atom probe analyses. Part I conventional 1D atom probeF Danoix, G Grancher, A Bostel, et al.
Ultramicroscopy|May 15, 2007
Redesign of the scanning electron microscope for parallel energy spectral acquisitionAnjam Khursheed, Hung Quang Hoang
Ultramicroscopy|June 5, 2007
Effect of sample bending on diffracted intensities observed in CBED patterns of plan view strained samplesF Houdellier, D Jacob, M J Casanove, et al.
Ultramicroscopy|September 1, 1991
Biological calcium absorption edge imaging using monochromatic synchrotron radiationB J Panessa-Warren, G T Tortora, R L Stears, et al.
Ultramicroscopy|August 29, 2006
Short note on parallel illumination in the TEMD Eyidi, C Hébert, P Schattschneider
Ultramicroscopy|August 29, 2006
ELNES at magic angle conditionsC Hébert, P Schattschneider, H Franco, et al.
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