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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Redesign of the scanning electron microscope for parallel energy spectral acquisition

Anjam Khursheed1, Hung Quang Hoang

  • 1National University of Singapore, 4 Engineering Drive 3, Singapore 117576, Singapore. eleka@nus.edu.sg

Ultramicroscopy
|May 15, 2007
PubMed

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