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Ultramicroscopy|October 28, 2008
A second-order focusing electrostatic toroidal electron spectrometer with 2pi radian collectionAnjam Khursheed, Hung Quang HoangUltramicroscopy|May 15, 2007
Redesign of the scanning electron microscope for parallel energy spectral acquisitionAnjam Khursheed, Hung Quang HoangUltramicroscopy|July 7, 2009
Initial experimental results on a magnetic beam separator spectrometer for the SEMMans Osterberg, Hung Quang Hoang, Anjam KhursheedUltramicroscopy|May 12, 2005
A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopesAnjam KhursheedUltramicroscopy|March 12, 2013
Design of a focused electron beam column for ring-cathode sourcesAnjam KhursheedUltramicroscopy|December 21, 2002
Aberration characteristics of immersion lenses for LVSEMAnjam KhursheedMaterials (Basel, Switzerland)|December 24, 2021
The Design of a Reflection Electron Energy Loss Spectrometer Attachment for Low Voltage Scanning Electron MicroscopyJonathan Chuah, Anjam KhursheedMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2014
Probing and analyzing buried interfaces of multifunctional oxides using a secondary electron energy analyzerAvinash Srinivasan, Anjam KhursheedScanning|December 23, 2004
A spectroscopic scanning electron microscope designAnjam Khursheed, Mans OsterbergMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 31, 2015
Voltage and Dopant Concentration Measurements of Semiconductors using a Band-Pass Toroidal Energy Analyzer Inside a Scanning Electron MicroscopeAvinash Srinivasan, Anjam KhursheedPageof 2