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Ultramicroscopy|May 26, 2015
Spectroscopic XPEEM of highly conductive SI-doped GaN wiresO Renault, J Morin, P Tchoulfian, et al.
Ultramicroscopy|May 9, 2015
Determination of solute site occupancies within γ' precipitates in nickel-base superalloys via orientation-specific atom probe tomographyS Meher, T Rojhirunsakool, P Nandwana, et al.
Ultramicroscopy|May 12, 2015
Extracting features buried within high density atom probe point cloud data through simplicial homologySrikant Srinivasan, Kaustubh Kaluskar, Scott Broderick, et al.
Ultramicroscopy|May 19, 2015
New approaches to nanoparticle sample fabrication for atom probe tomographyP Felfer, T Li, K Eder, et al.
Ultramicroscopy|May 19, 2015
Orientation contrast of secondary electron images from electropolished metalsD Chen, C P Chang, M H Loretto
Ultramicroscopy|May 6, 2015
A rate adaptive control method for Improving the imaging speed of atomic force microscopyYanyan Wang, Jiahuan Wan, Xiaodong Hu, et al.
Ultramicroscopy|May 19, 2015
On the electron vortex beam wavefunction within a crystalB G Mendis
Ultramicroscopy|April 26, 2020
A high-speed atomic force microscopy with super resolution based on path planning scanningYinan Wu, Yongchun Fang, Chao Wang, et al.
Ultramicroscopy|May 15, 2021
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometryA L Marshall, J Holzer, P Stejskal, et al.
Ultramicroscopy|May 17, 2021
Low terahertz-band scanning near-field microscope with 155-nm resolutionGuangbin Dai, Jie Wang, Xiaoxuan Zhang, et al.
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