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Ultramicroscopy|March 30, 2004
A unique determination of boundary condition in quantitative electron diffraction: Application to accurate measurements of mean inner potentialsL Wu, M A Schofield, Y Zhu, et al.Ultramicroscopy|March 30, 2004
Structural study of new hydrocarbon nano-crystals by energy-filtered electron diffractionJ S Wu, N Melcer, W P Sharp, et al.Ultramicroscopy|March 30, 2004
Elastic constants of Si crystal determined by thermal diffuse electron scatteringRenhui Wang, Jianhua Yin, Jianian Gui, et al.Ultramicroscopy|March 30, 2004
TRICE - A program for reconstructing 3D reciprocal space and determining unit-cell parametersX D Xiaodong Zou, Anders Hovmöller, Sven HovmöllerUltramicroscopy|March 30, 2004
Electron microscopy study on a new phase in beta-titanium alloys aged at a high temperatureE Sukedai, H Yagi, D Yoshimitsu, et al.Ultramicroscopy|March 30, 2004
TEM study of the structural dependence of the epitaxial passive oxide films on crystal facets in polyhedral nanoparticles of chromiumJ C Rao, X X Zhang, B Qin, et al.Ultramicroscopy|March 12, 2004
A new design of specimen stage for in situ magnetising experiments in the transmission electron microscopeG Yi, W A P Nicholson, C K Lim, et al.Ultramicroscopy|March 12, 2004
Measuring the absolute position of EELS ionisation edges in a TEMP L Potapov, D SchryversUltramicroscopy|October 1, 1992
Automatic focus correction for spot-scan imaging of tilted specimensK H DowningUltramicroscopy|October 1, 1992
Processing images of helical structures: a new twistD G Morgan, D DeRosierPageof 460