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Ultramicroscopy|July 3, 2004
Nanomechanical characterization of multilayered thin film structures for digital micromirror devicesGuohua Wei, Bharat Bhushan, S Joshua Jacobs
Ultramicroscopy|July 3, 2004
Fabrication of conjugated polymers nanostructures via direct near-field optical lithographyF Cacialli, Robert Riehn, A Downes, et al.
Ultramicroscopy|January 14, 2022
Standardizing resolution definition in scanning helium microscopyM Bergin, W Roland-Batty, C J Hatchwell, et al.
Ultramicroscopy|September 14, 2022
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlationsMichael Scheucher, Thomas Schachinger, Thomas Spielauer, et al.
Ultramicroscopy|January 11, 2022
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscopeTeresa Weßels, Simon Däster, Yoshie Murooka, et al.
Ultramicroscopy|December 16, 2021
Automatic determination of the spectrum-structure relationship by tree structure-based unsupervised and supervised learningShin Kiyohara, Kakeru Kikumasa, Kiyou Shibata, et al.
Ultramicroscopy|November 20, 2021
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolutionH L Robert, I Lobato, F J Lyu, et al.
Ultramicroscopy|November 5, 2021
Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopyMenglin Zhu, Jinwoo Hwang
Ultramicroscopy|November 2, 2022
Langmuir analysis of electron beam induced plasma in environmental TEMJ Lindner, U Ross, V Roddatis, et al.
Ultramicroscopy|October 2, 2022
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM SimulationAlex W Robinson, Daniel Nicholls, Jack Wells, et al.
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