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Ultramicroscopy|November 10, 2015
Intensity distribution analysis of cathodoluminescence using the energy loss distribution of electronsMasahiro Fukuta, Wataru Inami, Atsushi Ono, et al.Ultramicroscopy|March 19, 2016
An alternative approach for ζ-factor measurement using pure element nanoparticlesDaniele Zanaga, Thomas Altantzis, Jonathan Sanctorum, et al.Ultramicroscopy|March 22, 2016
Quantitative 3D electromagnetic field determination of 1D nanostructures from single projectionC Phatak, L de Knoop, F Houdellier, et al.Ultramicroscopy|February 27, 2016
On geometric artifacts in cryo electron tomographyBeata Turoňová, Lukas Marsalek, Philipp SlusallekUltramicroscopy|February 29, 2016
Optimization of a constrained linear monochromator design for neutral atom beamsThomas KaltenbacherUltramicroscopy|February 12, 2016
Highlighting material structure with transmission electron diffraction correlation coefficient mapsÁkos K Kiss, Edgar F Rauch, János L LábárUltramicroscopy|December 3, 2014
Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objectsOssi Lehtinen, Dorin Geiger, Zhongbo Lee, et al.Ultramicroscopy|December 3, 2014
High-resolution STEM imaging with a quadrant detector--conditions for differential phase contrast microscopy in the weak phase object approximationS Majert, H KohlUltramicroscopy|December 3, 2014
Retrieving depth-direction information from TEM diffraction data under reciprocal-space sampling variationRobert S Pennington, Christoph T KochUltramicroscopy|December 3, 2014
Towards denoising XMCD movies of fast magnetization dynamics using extended Kalman filterM Kopp, S Harmeling, G Schütz, et al.Pageof 460