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Ultramicroscopy|October 8, 2021
Anisotropic wet-chemical etching for preparation of freestanding films on Si substrates for atom probe tomography: A simple yet effective approachMichael Tkadletz, Alexandra Lechner, Silvia Pölzl, et al.Ultramicroscopy|October 2, 2021
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tiltAnnelies De Wael, Annick De Backer, Ivan Lobato, et al.Ultramicroscopy|October 12, 2021
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLSJ Blanco-Portals, P Torruella, F Baiutti, et al.Ultramicroscopy|October 4, 2021
The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic methodJingchao Li, Congcong Sun, Yamei Lin, et al.Ultramicroscopy|May 1, 2022
Image based evaluation of textured 3DSEM modelsTuomas Sihvonen, Satu-Pia ReinikainenUltramicroscopy|January 1, 1978
Complementary structures of membrane fracture faces obtained by ultrahigh vacuum freeze-fracturing at -196 degrees C and digital image processingO Kübler, H Gross, H MoorUltramicroscopy|April 22, 2022
Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometryKevin J Coakley, Norman A SanfordUltramicroscopy|October 14, 2019
Design for a high resolution electron energy loss microscopeMarian Mankos, Khashayar Shadman, Raphaël Hahn, et al.Ultramicroscopy|June 28, 2019
Atomic force microscopy with integrated on-chip interferometric readoutMichal Zawierta, Roger D Jeffery, Gino Putrino, et al.Ultramicroscopy|February 12, 2022
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopyValter Maurino, Francesco Pellegrino, Gian Bartolo Picotto, et al.Pageof 460