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Ultramicroscopy|July 28, 2020
The use of a piezoelectric force sensor in the magnetic force microscopy of thin permalloy filmsA P Cherkun, G V Mishakov, A V Sharkov, et al.Ultramicroscopy|August 2, 2020
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructuresV A Golyashov, V S Rusetsky, T S Shamirzaev, et al.Ultramicroscopy|April 21, 2021
The studies on wet chemical etching via in situ liquid cell TEMMei Sun, Jiamin Tian, Qing ChenUltramicroscopy|April 23, 2021
Combining quantitative ADF STEM with SiNx membrane-based MEMS devices: A simulation study with Pt nanoparticlesKatherine E MacArthur, Antoine Clement, Marc Heggen, et al.Ultramicroscopy|April 27, 2021
Tuneable in-situ nanoCT workflow using FIB/SEMPaulína Barabasová, Veronika Kováčová, Pavel Stejskal, et al.Ultramicroscopy|June 28, 2020
Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructuresEmily M Turner, Keshab R Sapkota, Christopher Hatem, et al.Ultramicroscopy|January 17, 2002
Lensless imaging: a workshop on "new approaches to the phase problem for non-periodic objects."Spence JCH, M Howells, L D Marks, et al.Ultramicroscopy|September 6, 2002
Determination of crystal polarity from bend contours in transmission electron microscope imagesE SpieckerUltramicroscopy|September 6, 2002
Conducting, semiconducting and insulating objects observed by low-energy electron holographyJ Bardon, A Degiovanni, V Georges, et al.Ultramicroscopy|September 6, 2002
Detection of hydrogen by electron Rutherford backscatteringMaarten VosPageof 460