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Ultramicroscopy|January 14, 2003
Apertureless near-field scanning Raman microscopy using reflection scattering geometryW X Sun, Z X ShenUltramicroscopy|January 14, 2003
Evaluation of a hybrid pixel detector for electron microscopyA R Faruqi, D M Cattermole, R Henderson, et al.Ultramicroscopy|January 14, 2003
Improved comparison of low energy loss spectra with band structure calculations: the example of BN filamentsP Moreau, M C CheynetUltramicroscopy|January 14, 2003
Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysisG R Anstis, D Q Cai, D J H CockayneUltramicroscopy|December 20, 2002
Theoretical analysis of the atomic force microscopy characterization of columnar thin filmsPetr Klapetek, Ivan OhlídalUltramicroscopy|January 5, 2002
Characterization of a high voltage flat panel display unit using nanotube-based emittersS Z Deng, Z S Wu, N S Xu, et al.Ultramicroscopy|January 5, 2002
A new approach to the interpretation of atom probe field-ion microscopy imagesF Vurpillot, A Bostel, D BlavetteUltramicroscopy|January 5, 2002
A model accounting for spatial overlaps in 3D atom-probe microscopyD Blavette, F Vurpillot, P Pareige, et al.Ultramicroscopy|January 5, 2002
Fabrication of specimens of metamorphic magnetite crystals for field ion microscopy and atom probe microanalysisK R Kuhlman, R L Martens, T F Kelly, et al.Ultramicroscopy|January 5, 2002
New results in the theory of Fowler-Nordheim plots and the modelling of hemi-ellipsoidal emittersR G Forbes, K L JensenPageof 460