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Ultramicroscopy|January 22, 2003
Field emission from individual multiwalled carbon nanotubes prepared in an electron microscopeN de Jonge, N J van DrutenUltramicroscopy|January 22, 2003
A high power density submicron electron beam sourceV E Ptitsin, V F TregubovUltramicroscopy|January 22, 2003
The application of carbon nanotubes in high-efficiency low power consumption field-emission luminescent tubeJun Chen, X Zhou, S Z Deng, et al.Ultramicroscopy|January 22, 2003
STM observation of steps and terraces on tungsten (211) surfaceS M Zuber, Z Szczudło, A Szczepkowicz, et al.Ultramicroscopy|January 22, 2003
Effects of incidence angles of ions on the mass resolution of an energy compensated 3D atom probeE Bémont, A Bostel, M Bouet, et al.Ultramicroscopy|January 22, 2003
Improvement of the mass resolution of the atom probe using a dual counter-electrodeB Deconihout, R Saint-Martin, C Jarnot, et al.Ultramicroscopy|December 31, 2002
Interpretation of secondary electron images obtained using a low vacuum SEMM Toth, B L Thiel, A M DonaldUltramicroscopy|December 31, 2002
Quantitative characterisation of chemical inhomogeneities in Al-Ag using high-resolution Z-contrast STEMR Erni, H Heinrich, G KostorzUltramicroscopy|April 4, 2003
Retrieving modulation parameters from HRTEM images of modulated structuresThomas Höche, Wolfgang NeumannUltramicroscopy|April 4, 2003
Electron diffraction from nanovolumes of amorphous material using coherent convergent illuminationW McBride, D J H Cockayne, D Nguyen-ManhPageof 460