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Ultramicroscopy|November 12, 2002
A trajectory-based algorithm to determine and refine Euler angles of projections in three-dimensional microscopy. Improvements and testsPier Luigi Bellon, Francesca Cantele, Sacha De Carlo, et al.
Ultramicroscopy|November 12, 2002
Moiré-like fringes in transmission electron microscopy images of coherently strained semiconductor islandsY Androussi, T Benabbas, A Lefebvre
Ultramicroscopy|November 12, 2002
An assay for local quality in cryo-electron micrographs of single particlesHaixiao Gao, Christian M T Spahn, Robert A Grassucci, et al.
Ultramicroscopy|October 17, 2002
Diffractogram tableaux by mouse clickJohannes Zemlin, Friedrich Zemlin
Ultramicroscopy|July 1, 1975
Electron microscope images of mercury atoms bound to DNA filamentM Tanaka, S Higashi-Fujime, R Uyeda
Ultramicroscopy|December 1, 1975
A method of using the incident beam tilt as a eucentric goniometer in transmission electron microscopyO Vingsbo, T Yanaka, K Shirota
Ultramicroscopy|December 1, 1975
High resolution imaging properties of the STEMV Beck, A V Crewe
Ultramicroscopy|June 13, 2003
Calibration of AFM cantilever spring constantsChristopher T Gibson, Brandon L Weeks, Chris Abell, et al.
Ultramicroscopy|June 13, 2003
Effects of temperature and pressure on microcantilever resonance responseJohann Mertens, Eric Finot, Thomas Thundat, et al.
Ultramicroscopy|June 13, 2003
A non-contact mode scanning force microscope optimised to image biological samples in liquidA Grant, L McDonnell
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