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Ultramicroscopy|June 13, 2003
Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopyTeodor Gotszalk, Piotr Grabiec, Ivo W Rangelow
Ultramicroscopy|June 13, 2003
AFM lithography of aluminum for fabrication of nanomechanical systemsZ J Davis, G Abadal, O Hansen, et al.
Ultramicroscopy|June 13, 2003
Feasibility of tunable MEMS photonic crystal devicesS Rajic, J L Corbeil, P G Datskos
Ultramicroscopy|June 13, 2003
Mechanical characterization of micro/nanoscale structures for MEMS/NEMS applications using nanoindentation techniquesXiaodong Li, Bharat Bhushan, Kazuki Takashima, et al.
Ultramicroscopy|March 26, 2013
Spatial decomposition of molecular ions within 3D atom probe reconstructionsAndrew Breen, Michael P Moody, Baptiste Gault, et al.
Ultramicroscopy|March 20, 2013
Atom probe tomography analysis of WC powderJonathan Weidow
Ultramicroscopy|March 26, 2013
Combination of in situ straining and ACOM TEM: a novel method for analysis of plastic deformation of nanocrystalline metalsA Kobler, A Kashiwar, H Hahn, et al.
Ultramicroscopy|September 28, 2011
KSpaceNavigator as a tool for computer-assisted sample tilting in high-resolution imaging, tomography and defect analysisT Duden, A Gautam, U Dahmen
Ultramicroscopy|November 18, 2011
Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopyBart Buijsse, Frank M H M van Laarhoven, Andreas K Schmid, et al.
Ultramicroscopy|November 18, 2011
Imaging properties of bright-field and annular-dark-field scanning confocal electron microscopy: II. point spread function analysisK Mitsuishi, A Hashimoto, M Takeguchi, et al.
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