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Ultramicroscopy|December 28, 2010
Mapping titanium and tin oxide phases using EELS: an application of independent component analysisF de la Peña, M-H Berger, J-F Hochepied, et al.
Ultramicroscopy|January 14, 2011
A comparison of the structure of solute clusters formed during thermal ageing and irradiationJ M Hyde, G Sha, E A Marquis, et al.
Ultramicroscopy|January 14, 2011
Field evaporation behavior in [0 0 1] FePt thin filmsK L Torres, B Geiser, M P Moody, et al.
Ultramicroscopy|January 18, 2011
Effects of laser pulsing on analysis of steels by atom probe tomographyFang Liu, Hans-Olof Andrén
Ultramicroscopy|February 4, 2011
Atom-probe for FinFET dopant characterizationA K Kambham, J Mody, M Gilbert, et al.
Ultramicroscopy|January 25, 2011
Reprint of: Surface electronic structure of Ti-covered W(1 1 1) by photofield emissionP Hadzel, L Jurczyszyn, R Kucharczyk
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