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Ultramicroscopy|November 19, 2011
Grain detection from 2d and 3d EBSD data--specification of the MTEX algorithmFlorian Bachmann, Ralf Hielscher, Helmut SchaebenUltramicroscopy|November 19, 2011
ELNES for boron, carbon, and nitrogen K-edges with different chemical environments in layered materials studied by density functional theoryJingying Lu, Shang-Peng Gao, Jun YuanUltramicroscopy|November 15, 2011
Scandium oxide coated polycrystalline tungsten studied using emission microscopy and photoelectron spectroscopyCongshang Wan, Joel M Vaughn, Jerzy T Sadowski, et al.Ultramicroscopy|June 7, 2012
Local quantification of the composition in GaAs/Al(x)Ga(1-x)As structures by thickness fringe analysisJ M Bonard, J D GanièreUltramicroscopy|June 7, 2012
TEM-tomography of FAU-zeolite crystals containing Pt-clustersJ O Bovin, V Alfredsson, G Karlsson, et al.Ultramicroscopy|June 7, 2012
Voltage-center and coma-free alignment for high-resolution electron microscopyK Ishizuka, K ShirotaUltramicroscopy|June 7, 2012
Unconventional immuno double labelling by energy filtered transmission electron microscopyP J Koeck, R R Schröder, M Haider, et al.Ultramicroscopy|June 7, 2012
A high efficiency annular dark field detector for STEME J Kirkland, M G ThomasUltramicroscopy|August 20, 2013
The ArrayGrid: a methodology for applying multiple samples to a single TEM specimen gridPablo Castro-Hartmann, Gerard Heck, Jose M Eltit, et al.Pageof 460