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Ultramicroscopy|June 7, 2000
Weak beam under convergent beam illuminationSchaublin, Meng, Stobbs
Ultramicroscopy|June 7, 2000
Quantification of high-resolution electron microscope images of amorphous carbonBoothroyd
Ultramicroscopy|June 7, 2000
The development of Fresnel contrast analysis, and the interpretation of mean inner potential profiles at interfacesDunin-Borkowski
Ultramicroscopy|March 31, 2000
A cantilever array-based artificial noseBaller, Lang, Fritz, et al.
Ultramicroscopy|March 31, 2000
Phase detection of electrostatic force by AFM with a conductive tipTakahashi, Kawamukai
Ultramicroscopy|March 31, 2000
Observations of sudden structural-changes of the faulted-halves of the DAS structure on quenched Si(1 1 1) by STMShimada, Tochihara, Sato, et al.
Ultramicroscopy|March 31, 2000
STM analyses of surface phenomena in Si(1 0 0) under proton irradiationKozodaev, Makeev, Suvorov
Ultramicroscopy|March 31, 2000
Manipulation of gold nanoparticles in liquid environments using scanning force microscopyResch, Lewis, Meltzer, et al.
Ultramicroscopy|March 31, 2000
Investigations into local ferroelectric properties by atomic force microscopyDurkan, Welland
Ultramicroscopy|March 31, 2000
Fabrication of a quantum point contact by the dynamic plowing technique and wet-chemical etchingSkaberna, Versen, Klehn, et al.
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