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Ultramicroscopy|April 20, 2013
Information extraction from FN plots of tungsten microemittersKhalil O Mussa, Marwan S Mousa, Andreas Fischer
Ultramicroscopy|March 19, 2013
Atomic insight into Ge₁₋xSnx using atom probe tomographyArul Kumar, Manu P Komalan, Haraprasanna Lenka, et al.
Ultramicroscopy|March 19, 2013
3D site specific sample preparation and analysis of 3D devices (FinFETs) by atom probe tomographyAjay Kumar Kambham, Arul Kumar, Matthieu Gilbert, et al.
Ultramicroscopy|April 2, 2013
Quantitative chemical evaluation of dilute GaNAs using ADF STEM: avoiding surface strain induced artifactsTim Grieb, Knut Müller, Rafael Fritz, et al.
Ultramicroscopy|April 16, 2013
A monochromatic, aberration-corrected, dual-beam low energy electron microscopeMarian Mankos, Khashayar Shadman
Ultramicroscopy|March 14, 2013
Influence of experimental parameters on the composition of precipitates in metallic alloysVirgile Gasnier, Baptiste Gault, Hidenori Nako, et al.
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