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Ultramicroscopy|May 16, 2015
Homogeneity and composition of AlInGaN: A multiprobe nanostructure studyFlorian F Krause, Jan-Philipp Ahl, Darius Tytko, et al.Ultramicroscopy|May 13, 2015
MULTEM: A new multislice program to perform accurate and fast electron diffraction and imaging simulations using Graphics Processing Units with CUDAI Lobato, D Van DyckUltramicroscopy|May 15, 2015
Double-tilt in situ TEM holder with multiple electrical contacts and its application in MEMS-based mechanical testing of nanomaterialsRodrigo A Bernal, Rajaprakash Ramachandramoorthy, Horacio D EspinosaUltramicroscopy|August 27, 2025
Improving the low-dose performance of aberration correction in single sideband ptychographySongge Li, Nicolas Gauquelin, Hoelen L Lalandec Robert, et al.Ultramicroscopy|January 1, 1984
A crystalline test specimen for checking the performance of high-resolution electron microscopesR Scholz, J HeydenreichUltramicroscopy|January 1, 1984
Detection of X-rays and electron energy loss events in time coincidenceP Kruit, H Shuman, A P SomlyoUltramicroscopy|January 1, 1981
Instrumentation for the three-dimensional reconstruction of cellular organelles by electron microscopyG F Bahr, B E Schell, W F EnglerUltramicroscopy|January 1, 1981
Ice crystals specifically decorate hydrophilic sites on freeze-fractured models membranesD Walzthöny, H Moor, H GrossUltramicroscopy|May 18, 2020
Bayesian approach to automatic mass-spectrum peak identification in atom probe tomographyA Mikhalychev, S Vlasenko, T R Payne, et al.Pageof 460