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Ultramicroscopy|February 9, 2016
3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomyTeruo Hashimoto, George E Thompson, Xiaorong Zhou, et al.Ultramicroscopy|July 21, 2017
Autofocus on moving object in scanning electron microscopeAndrey V Kudryavtsev, Sounkalo Dembélé, Nadine PiatUltramicroscopy|July 23, 2017
Simultaneous scanning tunneling microscopy and synchrotron X-ray measurements in a gas environmentRik V Mom, Willem G Onderwaater, Marcel J Rost, et al.Ultramicroscopy|August 6, 2017
Three-dimensional visualization of dislocations in a ferromagnetic material by magnetic-field-free electron tomographyKana L Hasezaki, Hikaru Saito, Takumi Sannomiya, et al.Ultramicroscopy|August 8, 2017
Evaluation of high-quality image reconstruction techniques applied to high-resolution Z-contrast imagingG Bárcena-González, M P Guerrero-Lebrero, E Guerrero, et al.Ultramicroscopy|June 24, 2016
Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffractionDavid Wallis, Lars N Hansen, T Ben Britton, et al.Ultramicroscopy|May 21, 2016
Generation and application of bessel beams in electron microscopyVincenzo Grillo, Jérémie Harris, Gian Carlo Gazzadi, et al.Ultramicroscopy|March 1, 1989
Circular harmonic averaging of noisy single-molecule imagesW Kunath, H Sack-KongehlUltramicroscopy|May 11, 2016
A universal equation for computing the beam broadening of incident electrons in thin filmsRaynald Gauvin, Samantha RudinskyUltramicroscopy|November 21, 2017
Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulationsLennart Duschek, Andreas Beyer, Jan Oliver Oelerich, et al.Pageof 460