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Ultramicroscopy|July 15, 2017
Spin-filtered time-of-flight k-space microscopy of Ir - Towards the "complete" photoemission experimentG Schönhense, K Medjanik, S Chernov, et al.Ultramicroscopy|January 8, 2018
Development of a high brightness ultrafast Transmission Electron Microscope based on a laser-driven cold field emission sourceF Houdellier, G M Caruso, S Weber, et al.Ultramicroscopy|November 29, 2020
Grain analysis of atomic force microscopy images via persistent homologyAli Nabi DumanUltramicroscopy|November 5, 2020
Three dimensional cluster analysis for atom probe tomography using Ripley's K-function and machine learningGalen B Vincent, Andrew P Proudian, Jeramy D ZimmermanUltramicroscopy|November 8, 2020
Laser ablation sample preparation for atom probe tomography and transmission electron microscopyN White, K Eder, J Byrnes, et al.Ultramicroscopy|September 8, 2020
FIB/SEM tomography segmentation by optical flow estimationRiko Moroni, Simon ThieleUltramicroscopy|September 8, 2020
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscaleV Prabhakara, D Jannis, G Guzzinati, et al.Ultramicroscopy|November 16, 2020
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisitionFulin Wang, McLean P Echlin, Aidan A Taylor, et al.Ultramicroscopy|June 20, 2022
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEMS Firoozabadi, P Kükelhan, A Beyer, et al.Ultramicroscopy|January 9, 2023
Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditionsZezhong Zhang, Ivan Lobato, Annick De Backer, et al.Pageof 460