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Ultramicroscopy|March 29, 2020
Convergent beam electron diffraction of multilayer Van der Waals structuresTatiana Latychevskaia, Colin Robert Woods, Yi Bo Wang, et al.Ultramicroscopy|January 15, 2019
Joint non-rigid image registration and reconstruction for quantitative atomic resolution scanning transmission electron microscopyBenjamin Berkels, Christian H LiebscherUltramicroscopy|September 25, 2020
Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrologyZhiyue Zheng, Sitian Gao, Wei Li, et al.Ultramicroscopy|September 24, 2020
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathodeJuyang Xia, Jijun Zou, Xincun Peng, et al.Ultramicroscopy|December 8, 2020
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopyFumihiko Uesugi, Shogo Koshiya, Jun Kikkawa, et al.Ultramicroscopy|October 8, 2020
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decompositionChenyu Zhang, Rungang Han, Anru R Zhang, et al.Ultramicroscopy|October 8, 2020
Scanning transmission electron microscopy image simulations of complex dislocation structures generated by discrete dislocation dynamicsJoseph Tessmer, Saransh Singh, Yejun Gu, et al.Ultramicroscopy|December 31, 2020
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in SiTim Grieb, Florian F Krause, Knut Müller-Caspary, et al.Ultramicroscopy|December 22, 2020
Robust scan synchronized force-fluorescence imagingPatrick Schmidt, John Lajoie, Sanjeevi SivasankarUltramicroscopy|November 12, 2020
FANM: A software for focus and aberrations of nuclear microprobeYanxin Dou, Jeroen Anton van KanPageof 460