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Ultramicroscopy|February 27, 2017
3D shaping of electron beams using amplitude masksRoy Shiloh, Ady ArieUltramicroscopy|March 13, 2017
High-resolution monochromated electron energy-loss spectroscopy of organic photovoltaic materialsJessica A Alexander, Frank J Scheltens, Lawrence F Drummy, et al.Ultramicroscopy|March 13, 2017
Manipulating low-dimensional materials down to the level of single atoms with electron irradiationToma Susi, Jannik C Meyer, Jani KotakoskiUltramicroscopy|March 13, 2017
A short story of imaging and spectroscopy of two-dimensional materials by scanning transmission electron microscopyJuan C Idrobo, Wu ZhouUltramicroscopy|March 10, 2019
Label-free 3D imaging of weakly absorbing samples using spatially-incoherent annular illumination microscopyXiao Ma, Bowen Zhou, Zijian Su, et al.Ultramicroscopy|March 13, 2019
Atomic scale characterization of point and extended defects in niobate thin filmsChangjian Li, Dongsheng Song, Mengsha Li, et al.Ultramicroscopy|March 12, 2019
Fundamentals of cathodoluminescence in a STEM: The impact of sample geometry and electron beam energy on light emission of semiconductorsMichael Stöger-Pollach, Kristýna Bukvišová, Sabine Schwarz, et al.Ultramicroscopy|August 6, 2019
Improving the imaging capability of an on-axis transmission Kikuchi detectorAlice Bastos S Fanta, Adam Fuller, Hossein Alimadadi, et al.Ultramicroscopy|August 25, 2019
Extremely low count detection for EELS spectrum imaging by reducing CCD read-out noiseMitsutaka Haruta, Yoshifumi Fujiyoshi, Takashi Nemoto, et al.Pageof 460