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Ultramicroscopy|April 28, 2024
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)Nicolas Dumaresq, Nicolas Brodusch, Stéphanie Bessette, et al.
Ultramicroscopy|April 19, 2024
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learningEliška Materna Mikmeková, Jiří Materna, Ivo Konvalina, et al.
Ultramicroscopy|January 7, 2026
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychographyDana O Byrne, Stephanie M Ribet, Demie Kepaptsoglou, et al.
Ultramicroscopy|December 6, 2025
Development of a 100 MHz scan controller for the electron microscopeOvidiu Cretu, Koji Kimoto
Ultramicroscopy|December 4, 2025
Fast tapping mode atomic force microscopy based on fuzzy PI controllerLijia Ji, Renjie Gui, Jinbo Chen, et al.
Ultramicroscopy|December 12, 2025
Performance evaluation of deep-ultraviolet laser-assisted Invizo 6000 and near-ultraviolet laser-assisted LEAP 5000 for a range of material systemsChang-Gi Lee, Byeong-Gyu Chae, I-Jun Ro, et al.
Ultramicroscopy|January 15, 2025
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effectsYi-Chieh Yang, Luca Serafini, Nicolas Gauquelin, et al.
Ultramicroscopy|January 18, 2025
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEMSupriya Ghosh, Fengdeng Liu, Sreejith Nair, et al.
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Ultramicroscopy|December 12, 2024
Workflow automation of SEM acquisitions and feature trackingSabrina Clusiau, Nicolas Piché, Nicolas Brodusch, et al.
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