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Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron
Dana O Byrne1, Stephanie M Ribet2, Demie Kepaptsoglou3
1Department of Chemistry, University of California, Berkeley, CA, 94720, USA; Department of Materials Science and Engineering, University of California, Berkeley, CA, 94720, USA; Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Abstract:
Tetravacancies in monolayer hexagonal boron nitride (hBN) with consistent edge termination (boron or nitrogen) form triangular nanopores with electrostatic potentials that can be leveraged for applications such as selective ion transport and neuromorphic computing. In order to quantitatively predict the properties of these structures, an atomic-level understanding of their local electronic and chemical environments is required. Moreover, robust methods for their precision manufacture are needed. Here we use electron irradiation in a scanning transmission electron microscope (STEM) at a high dose rate to drive the formation of boron-terminated tetravacancies in monolayer hBN. Characterization of the defects is achieved using aberration-corrected STEM, monochromated electron energy-loss spectroscopy (EELS), and electron ptychography. Z-contrast in STEM and chemical fingerprinting by core-loss EELS enable identification of the edge terminations, while electron ptychography gives insight into structural relaxation of the tetravacancies and provides evidence of enhanced electron density around the defect perimeters indicative of bonding effects.
