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Ultramicroscopy|October 22, 2023
Optimizing experimental parameters for orbital mappingManuel Ederer, Stefan LöfflerUltramicroscopy|October 18, 2023
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloysE Thronsen, T Bergh, T I Thorsen, et al.Ultramicroscopy|October 14, 2023
Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrologySoheil Khajavi, Zahra Shaterzadeh-Yazdi, Ali Eghrari, et al.Ultramicroscopy|July 15, 2023
Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holographyJean Felix Dushimineza, Janghyun Jo, Rafal E Dunin-Borkowski, et al.Ultramicroscopy|August 16, 2023
Soft X-ray Fermi surface tomography of palladium and rhodium via momentum microscopyXin Liang Tan, Kenta Hagiwara, Ying-Jiun Chen, et al.Ultramicroscopy|August 7, 2023
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopyAndrew J Winchester, Travis J Anderson, Jennifer K Hite, et al.Ultramicroscopy|July 29, 2023
Breaking the 10 nm barrier using molecular ions in nuclear microprobesYanxin Dou, Thomas Osipowicz, Jeroen Anton van KanUltramicroscopy|August 26, 2023
Convexity constraints on linear background models for electron energy-loss spectraWouter Van den Broek, Daen Jannis, Jo VerbeeckUltramicroscopy|August 26, 2023
Reliable phase quantification in focused probe electron ptychography of thin materialsChristoph Hofer, Timothy J PennycookUltramicroscopy|June 26, 2023
Visualization of molecular stacking using low-energy electron microscopyPavel Procházka, Jan ČechalPageof 460