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Ultramicroscopy|February 10, 2017
Three-dimensional analysis of Eu dopant atoms in Ca-α-SiAlON via through-focus HAADF-STEM imagingGenki Saito, Fuuta Yamaki, Yuji Kunisada, et al.Ultramicroscopy|January 5, 2017
Local temperature measurement in TEM by parallel beam electron diffractionFlorian Niekiel, Simon M Kraschewski, Julian Müller, et al.Ultramicroscopy|February 1, 2017
Ultrafast transmission electron microscopy using a laser-driven field emitter: Femtosecond resolution with a high coherence electron beamArmin Feist, Nora Bach, Nara Rubiano da Silva, et al.Ultramicroscopy|October 30, 2016
Fabrication of thin TEM sample of ionic liquid for high-resolution ELNES measurementsTomohiro Miyata, Teruyasu MizoguchiUltramicroscopy|December 18, 2017
Preventing damage and redeposition during focused ion beam milling: The "umbrella" methodT Vermeij, E Plancher, C C TasanUltramicroscopy|September 11, 2019
Plan-view sample preparation of a buried nanodots array by FIB with accurate EDS positioning in thickness directionChaorong Zhong, Lina Lin, Ruijuan Qi, et al.Ultramicroscopy|March 10, 2019
A near ambient pressure photoemission electron microscope (NAP-PEEM)Yanxiao Ning, Qiang Fu, Yifan Li, et al.Ultramicroscopy|March 25, 2019
Magnetic measurement by electron magnetic circular dichroism in the transmission electron microscopeDongsheng Song, Ziqiang Wang, Jing ZhuUltramicroscopy|December 15, 2020
Active calibration reference of minimized height for characterization of scanning thermal microscopy systemsPaweł Janus, Dariusz Szmigiel, Andrzej Sierakowski, et al.Pageof 460