Transmission Electron Microscopy
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Updated: Mar 9, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Florian Niekiel1, Simon M Kraschewski1, Julian Müller1
1Department of Material Science and Engineering, Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy, Friedrich-Alexander-Universität Erlangen-Nürnberg, Cauerstr. 6, 91058 Erlangen, Germany.
This study introduces a new method using electron diffraction to precisely measure local sample temperatures up to 890°C in transmission electron microscopy. This technique is vital for advanced in situ heating experiments and real-time temperature monitoring.
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