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Ultramicroscopy|April 25, 2017
Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolutionHao Yang, Ian MacLaren, Lewys Jones, et al.Ultramicroscopy|February 26, 2017
Studying substrate effects on localized surface plasmons in an individual silver nanoparticle using electron energy-loss spectroscopyYoshifumi Fujiyoshi, Takashi Nemoto, Hiroki KurataUltramicroscopy|January 1, 1984
Negative staining characteristics of arrays of mitochondrial pore protein: use of correspondence analysis to classify different staining patternsC A Mannella, J FrankUltramicroscopy|February 1, 1995
Implementation of an NSOM system for fluorescence microscopyE Monson, G Merritt, S Smith, et al.Ultramicroscopy|August 1, 1994
Stereoscopy by tilted illumination in transmission electron microscopyG Y Fan, M H EllismanUltramicroscopy|July 24, 2007
Circular Hough transform diffraction analysis: a software tool for automated measurement of selected area electron diffraction patterns within Digital MicrographD R G MitchellUltramicroscopy|July 24, 2007
Comparative study of different process steps for the near-field optical probes manufacturingM Chaigneau, T Minea, G LouarnUltramicroscopy|October 5, 2007
Cell imaging by coherent backscattering microscopy using frequency-shifted optical feedback in a microchip laserO Hugon, I A Paun, C Ricard, et al.Ultramicroscopy|July 28, 2006
Electron inelastic scattering and anisotropy: The two-dimensional point of viewG Radtke, G A Botton, J VerbeeckUltramicroscopy|July 28, 2006
Static-charging mitigation and contamination avoidance by selective carbon coating of TEM samplesThomas Höche, Jürgen W Gerlach, Tino PetschPageof 460