Showing results (531-540 of 4,593) with videos related to
Sort By:
Pageof 460
Ultramicroscopy|March 30, 2004
Refinement in quantitative convergent beam electron diffraction (QCBED)F Feng, A H Zhang, J ZhuUltramicroscopy|March 30, 2004
Randomization of heavily damaged regions in annealed low energy Ge(+)-implanted (001)SiH H Lin, S L Cheng, L J Chen, et al.Ultramicroscopy|March 30, 2004
High-resolution scanning tunneling microscopy for moleculesBin Li, Haiqian Wang, Jinlong Yang, et al.Ultramicroscopy|March 22, 2005
A versatile double aberration-corrected, energy filtered HREM/STEM for materials scienceJohn L Hutchison, John M Titchmarsh, David J H Cockayne, et al.Ultramicroscopy|March 22, 2005
Dynamic profile calculation of deposition resolution by high-energy electrons in electron-beam-induced depositionK Mitsuishi, Z Q Liu, M Shimojo, et al.Ultramicroscopy|August 2, 2005
The injected-charge contrast mechanism in scanned imaging of doped semiconductors by very slow electronsLudĕk Frank, Ilona MüllerováUltramicroscopy|August 4, 2005
Imaging of P-glycoprotein of H69/VP small-cell lung cancer lines by scanning near-field optical microscopy and confocal laser microspectrofluorometerWeihong Qiao, Guangyi Shang, Franck H Lei, et al.Ultramicroscopy|September 29, 2004
Nanofabrication of cylindrical STEM specimen of InGaAs/GaAs quantum dots for 3D-STEM observationKazunari Ozasa, Yoshinobu Aoyagi, Masaya Iwaki, et al.Ultramicroscopy|September 29, 2004
Cross-section analysis of organic light-emitting diodesBernhard Schaffer, Christoph Mitterbauer, Andreas Schertel, et al.Ultramicroscopy|September 29, 2004
Coherence and sampling requirements for diffractive imagingJ C H Spence, U Weierstall, M HowellsPageof 460