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Ultramicroscopy|June 12, 2018
Fabrication of a trimer/single atom tip for gas field ion sources by means of field evaporation without tip heatingKwang-Il Kim, Young Heon Kim, Takashi Ogawa, et al.Ultramicroscopy|May 30, 2018
Image registration of low signal-to-noise cryo-STEM dataBenjamin H Savitzky, Ismail El Baggari, Colin B Clement, et al.Ultramicroscopy|January 19, 2010
Multiple scattering effects of MeV electrons in very thick amorphous specimensFang Wang, Hai-Bo Zhang, Meng Cao, et al.Ultramicroscopy|September 18, 2016
Applications and limitations of electron correlation microscopy to study relaxation dynamics in supercooled liquidsPei Zhang, Li He, Matthew F Besser, et al.Ultramicroscopy|September 18, 2016
Prospects for quantitative and time-resolved double and continuous exposure off-axis electron holographyVadim Migunov, Christian Dwyer, Chris B Boothroyd, et al.Ultramicroscopy|April 29, 2017
Vacuum scanning capillary photoemission microscopyS A Aseyev, A P Cherkun, B N Mironov, et al.Ultramicroscopy|May 9, 2017
Response to the comment by C. Kisielowski, H.A. Calderon, F.R. Chen, S. Helveg, J.R. Jinschek, P. Specht, D. Van Dyck on the article "On the influence of the electron dose-rate on the HRTEM image contrast" by J. Barthel, M. Lentzen, A. Thust, Ultramicroscopy 176 (2017) 37-45Juri Barthel, Markus Lentzen, Andreas ThustUltramicroscopy|July 10, 2017
Origin of atomic displacement in HAADF image of the tilted specimenJ Cui, Y Yao, Y G Wang, et al.Ultramicroscopy|April 16, 2018
Robust workflow and instrumentation for cryo-focused ion beam milling of samples for electron cryotomographyJoão M Medeiros, Désirée Böck, Gregor L Weiss, et al.Ultramicroscopy|April 8, 2018
Accurate interpolation of 3D fields in charged particle opticsMichal Horák, Viktor Badin, Jakub ZlámalPageof 460