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Ultramicroscopy|July 3, 2017
Toward an accurate quantification in atom probe tomography reconstruction by correlative electron tomography approach on nanoporous materialsIsabelle Mouton, Tony Printemps, Adeline Grenier, et al.Ultramicroscopy|January 12, 2010
Material contrast in SEM: Fermi energy and work function effectsJacques CazauxUltramicroscopy|August 24, 2016
High temperature conductance mapping for correlation of electrical properties with micron-sized chemical and microstructural featuresKarin Vels Hansen, Kion Norrman, Torben JacobsenUltramicroscopy|December 22, 2009
Simulation of scanning transmission electron microscope images on desktop computersC DwyerUltramicroscopy|December 22, 2009
Cs corrected STEM EELS: Analysing beam sensitive carbon nanomaterials in cellular structuresMhairi H Gass, Alexandra E Porter, James S Bendall, et al.Ultramicroscopy|December 22, 2009
Near-field scanning optical microscopy using polymethylmethacrylate optical fiber probesH Chibani, K Dukenbayev, M Mensi, et al.Ultramicroscopy|November 10, 2009
Theoretical aspects of image formation in the aberration-corrected electron microscopeH RoseUltramicroscopy|November 10, 2009
Multivariate statistics applications in phase analysis of STEM-EDS spectrum imagesChad M Parish, Luke N BrewerUltramicroscopy|March 16, 2010
Molecular recognition imaging using tuning fork-based transverse dynamic force microscopyManuel Hofer, Stefan Adamsmaier, Thomas S van Zanten, et al.Ultramicroscopy|March 19, 2010
Molecular dynamics of DNA and nucleosomes in solution studied by fast-scanning atomic force microscopyYuki Suzuki, Yuji Higuchi, Kohji Hizume, et al.Pageof 460